SCOPUS 정보 검색 플랫폼

Volumn 47, Issue 4 PART 1, 2000, Pages 1375-1380

Probe station testing of large area silicon drift detectors

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER CONTROL; ELECTRIC CURRENT MEASUREMENT; LEAKAGE CURRENTS; PROBES; SEMICONDUCTING SILICON; VOLTAGE MEASUREMENT;

PROBE STATION TESTING; SILICON DRIFT DETECTORS;

RADIATION DETECTORS;

EID: 0034245354 PISSN: 00189499 EISSN: None Source Type: Journal
DOI: 10.1109/23.872981 Document Type: Article

Times cited : (3)

References (13)

1
- 6044224091
- J.W.Harris and the STAR collaboration. Nucl. Phys. A566 (1994) 277c-286c.
- Harris¹

2
- 48549113488
- 225 (1984) 608.
- E.Gatti and P. Rchak, Nucl. Inst. and Meth. 225 (1984) 608.
- Nucl. Inst. and Meth.
- Gatti, E.¹ Rchak, P.²

3
- 0021410153
- 235 (1985) 224-234.
- P.Rehak et al., Nucl. Inst. and Meth. A235 (1985) 224-234.
- Nucl. Inst. and Meth. A
- Al, P.R.E.¹

4
- 0030212206
- 377 (1996) 387-392.
- R.Bellwied et al., Nucl. Inst. and Meth., A377 (1996) 387-392.
- Nucl. Inst. and Meth., A
- Al, R.B.E.¹

5
- 0031338048
- 400 (1997) 279-286.
- R.Bellwied et al., Nucl. Inst. and Meth., A400 (1997) 279-286.
- Nucl. Inst. and Meth., A
- Al, R.B.E.¹

6
- 33747782811
- 11.6 A(Gev/c) with silicon drift detector array from the AGS experiment E896. submitted to Nucl. Phys, A
- G.LoCourto et al., Strange and multi-strange baryon measurement in Au + Au collisions at 11.6 A(Gev/c) with silicon drift detector array from the AGS experiment E896. submitted to Nucl. Phys, A
- Strange and Multi-strange Baryon Measurement in Au + Au Collisions at
- Al, G.L.E.¹

7
- 0004005306
- 1981
- S.M.Sze, Physics of Semiconductor Devices. John Wiley & Sons, 1981
- Physics of Semiconductor Devices. John Wiley & Sons
- Sze, S.M.¹

8
- 0003879668
- 1967
- A.S.Grove, Physics and Technology of Semiconductor Devices. John Wiley & Sons, 1967
- Physics and Technology of Semiconductor Devices. John Wiley & Sons
- Grove, A.S.¹

9
- 33747766076
- 40 Channel Thick Film Hybrid Circuit for Readout of Silicon Drift Detectors, presented on 8th Europian Symposium on Semiconductor Detectors and submitted to Nucl. Inst. and Meth.
- D.Lynn et al., A 240 Channel Thick Film Hybrid Circuit for Readout of Silicon Drift Detectors, presented on 8th Europian Symposium on Semiconductor Detectors and submitted to Nucl. Inst. and Meth.
- A 2
- Al, D.L.E.¹

10
- 33747760300
- 900 Main Street South, Building 1, Southbury, CT 06488, phone: (203) 264-4189, fax: (203)264-4210
- Probe Technology Corp., Eastern Regional Office: 900 Main Street South, Building 1, Southbury, CT 06488, phone: (203) 264-4189, fax: (203)264-4210
- Eastern Regional Office
- Corp, P.T.¹

11
- 33747767491
- 5.14, 5.24, 6.2.
- The Newport Catalog 94/95, p. 5.14, 5.24, 6.2.
- P.

12
- 33747766738
- 4606 and 4615, Daedal Manual & Motorized Positioning Systems, Catalog 000-9132-01, p.A20
- Ball Bearing Slides, Models 4606 and 4615, Daedal Manual & Motorized Positioning Systems, Catalog 000-9132-01, p.A20
- Models
- Slides, B.B.¹

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