Alkyl chain length dependence of field-effect mobilities in regioregular poly(3-alkylthiophene) films

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 39, Issue 8 B, 2000, Pages

  Kaneto, Keiichi ^b   Lim, Wee Y ^b   Takashima, Wataru ^b   Endo, Takeshi ^a   Rikukawa, Masahiro ^a  

^a SOPHIA UNIVERSITY   (Japan)

^b KYUSHU INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AROMATIC POLYMERS; CARRIER CONCENTRATION; CARRIER MOBILITY; MOLECULAR DYNAMICS; MOLECULAR STRUCTURE; SULFUR COMPOUNDS;

POLYALKYLTHIOPHENE;

PLASTIC FILMS;

EID: 0034245026     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.l872     Document Type: Article

References (20)

1. G. Gustafsson, Y. Cao, G. M. Treacy, F. Klavetter, N. Colaneri and A. J. Heeger: Nature 357 (1992) 477.
2. J. J. M. Halls, C. A. Walsh, N. C. Greenham, E. A. Marseglia, R. H. Friend, S. C. Moratti and A. B. Holmes: Nature 395 (1998) 498.
3. A. Tsumura, H. Koezuka and T. Ando: Appl. Phys. Lett. 49 (1986) 1210.
4. Y. Ohmori, H. Takahashi, K. Muro, M. Uchida, T. Kawai and K. Yoshino: Jpn. J. Appl. Phys. 30 (1991) L610.
5. M. Kobashi and H. Takeuchi: Macromolecules 31 (1998) 7273.
6. N. T. Binh, L. Q. Minh and H. Bässler: Synth. Met. 58 (1993) 39.
7. E. Lebedev, T. Dittrich, V. Petrova-Koch, S. Karg and W. Brutting: Appl. Phys. Lett. 71 (1997) 2686.
8. N. Camaioni, G. C.-Micel, A. Geri and S. Nicoleti: Appl. Phys. Lett. 73 (1998) 253.
9. T.-A. Chen and R. D. Rieke: J. Am. Chem. Soc. 114 (1992) 10087.
10. T.-A. Chen, X. Wu and R. D. Ricke: J. Am. Chem. Soc. 117 (1995) 233.
11. Z. Bao, A. Dodabalapur and A. J. Lovinger: Appl. Phys. Lett. 69 (1996) 4108.
12. K. Kaneto, K. Hatae, S. Nagamatsu, W. Takashima, S. S. Pandey, K. Endo and M. Rikukawa: Jpn. J. Appl. Phys. 38 (1999) L1188.
13. W. Y. Lim, S. Nagamatsu, W. Takashima, T. Endo, M. Rikukawa and K. Kaneto: to be published in IEICE Trans. E83-A (2000).
14. M. Rikukawa, Y. Tabuchi, K. Ochiai, K. Sanui and N. Ogata: Thin Solid Films 327-329 (1998) 469.
15. D. K. Schroder: Semiconductor Material & Device Characterization (J. Wiley & Sons, Inc., New York, 1990) p. 226.
16. R. D. McCullough, R. D. Lowe, M. Jayaraman and D. L. Anderson: J. Org. Chem. 58 (1993) 904.
17. W. Takashima, S. S. Pandey, M. Rikukawa and K. Kaneto: Tech. Rep. IEICE OME99-17 (1999) 29 [in Japanese].
18. T. Matsumoto, W. Takashima, M. Rikukawa and K. Kaneto: to be published in Jpn. J. Appl. Phys. 39 (2000).
19. H. Sirringhaus, N. Tessler and R. H. Friend: Science 280 (1998) 1741.
20. S. S. Pandey, S. Nagamatsu, W. Takashima, T. Endo, M. Rikukawa and K. Kaneto: to be published in Synth. Met. (2000).