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Volumn 31, Issue 7, 1984, Pages 609-622

A Unified Decomposition Approach for Fault Location in Large Analog Circuits

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC NETWORKS - ANALYSIS;

EID: 0021466631     PISSN: 00984094     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCS.1984.1085558     Document Type: Article
Times cited : (53)

References (20)
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  • 3
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  • 4
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  • 5
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    • Location of fault regions in analog circuits
    • Faculty of Engineering, McMaster University, Hamilton, Canada, Rep. SOC-285
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    • (1981)
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  • 8
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    • Diagnosability of nonlinear circuits and systems—Part I: The dc-case
    • V. Visvanathan and A. Sangiovanni-Vincentelli, “Diagnosability of nonlinear circuits and systems—Part I: The dc-case,” IEEE Trans. Circuits Syst., vol. CAS-28, pp. 1093–1102, 1981.
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  • 9
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    • Hankley, W.J.1    Merrill, H.M.2
  • 10
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    • Merrill, H.M.1
  • 11
    • 0015640512 scopus 로고
    • Fault isolation with insufficient measurements
    • M. N. Ransom and R. Saeks, “Fault isolation with insufficient measurements,” IEEE Trans. Circuit Theory, vol. CT-20, pp. 416–417, 1970.
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  • 12
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  • 13
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  • 14
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  • 17
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  • 18
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.