Novel measurement method of segregating adlayers in MBE

Thin Solid Films

Volumn 369, Issue 1, 2000, Pages 138-142

  Oehme, M ^a   Bauer, M ^a   Grasby, T ^b   Kasper, E ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

^b UNIVERSITY OF WARWICK   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

FILM GROWTH; MOLECULAR BEAM EPITAXY; SEMICONDUCTING BORON; SEMICONDUCTING SILICON; SEMICONDUCTOR DOPING; SEMICONDUCTOR GROWTH;

ADLAYERS;

SEMICONDUCTING FILMS;

EID: 0034230248     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)00793-8     Document Type: Article

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