Vertically integrated sensors for advanced imaging applications

IEEE Journal of Solid-State Circuits

Volumn 35, Issue 7, 2000, Pages 939-945

  Benthien, Stephan ^a   Lulé, Tarek ^a   Schneider, Bernd ^b   Wagner, Michael ^a   Verhoeven, Markus ^a   Böhm, Markus ^a,b  

^a Silicon Vision GmbH   (Germany)

^b UNIVERSITY OF SIEGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; CMOS INTEGRATED CIRCUITS; IMAGE QUALITY; IMAGE SENSORS; MICROPROCESSOR CHIPS; OPTICAL CORRELATION; THIN FILMS;

HIGH-RESOLUTION IMAGE SENSORS; LOCAL AUTOADAPTIVE SENSORS;

APPLICATION SPECIFIC INTEGRATED CIRCUITS;

EID: 0034229737     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/4.848201     Document Type: Article

References (15)

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