Integrated AFM and SANS approach toward understanding void formation in conductive composite materials

Macromolecules

Volumn 33, Issue 14, 2000, Pages 5198-5203

  Oakey, J ^a   Marr, D W M ^a   Schwartz, K B ^b   Wartenberg, M ^b  

^a Department of Geology and Geological Engineering   (United States)

^b Tyco Electronics   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLIZATION; INTERFACES (MATERIALS); MORPHOLOGY; NEUTRON SCATTERING; THICKNESS MEASUREMENT; VOLUME FRACTION;

POLYMER CRYSTALLINITY; SMALL ANGLE NEUTRON SCATTERING; VOID FORMATION;

POLYETHYLENES;

EID: 0034227061     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma0000024     Document Type: Article

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