Phase imaging in tapping mode AFM: Discrimination between metal clusters and the surfactant polymer

New Journal of Chemistry

Volumn 21, Issue 8, 1997, Pages 851-855

  Keita, B ^a   Nadjo, L ^a   Gachard, E ^b   Remita, H ^b   Khatouri, J ^b   Belloni, J ^b  

^a CNRS   (France)

^b UNIVERSITÉ PARIS SUD   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001741545     PISSN: 11440546     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (19)

1. Small Particles and Inorganic Clusters, Proceedings of the Sixth International Symposium on Small Particles and Inorganic Clusters, Chicago, USA, Sept. 1992,
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19. The basic principles of phase imaging with the Extender Electronics Module are taken from several "Applications Notes" which are available on request from Digital Instruments (Santa Barbara, CA).