Tuning the contour lengths and persistence lengths of cationic micelles: The role of electrostatics and specific ion binding

Journal of Physical Chemistry B

Volumn 104, Issue 29, 2000, Pages 6717-6727

  Magid, L J ^a   Han, Z ^a   Li, Z ^a   Butler, P D ^b  

^a UNIVERSITY OF TENNESSEE   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AROMATIC COMPOUNDS; CHEMICAL BONDS; ELECTROSTATICS; IONIC STRENGTH; POSITIVE IONS; SALTS; SODIUM CHLORIDE; SURFACE ACTIVE AGENTS; SURFACE PHENOMENA;

CATIONIC MICELLES; CETYLTRIMETHYLAMMONIUM CHLORIDE; CETYLTRIMETHYLAMMONIUM DICHLOROBENZOATE; ION BINDING; SURFACE CHARGE DENSITY;

MICELLES;

EID: 0034226069     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp994477c     Document Type: Article

References (66)

1. Israelachvili, J. N.; Mitchell, D. J.; Ninham, B. W. J. Chem. Soc., Faraday Trans. 2 1976, 72, 1525.
2. Carver, M.; Smith, T. L.; Gee, J. C.; Delichere, A.; Caponetti, E.; Magid, L. J. Langmuir 1996, 12, 691.
3. (a) Hoffmann, H.; Rehage, H.; Reizlein, K. Thurn, H. Proceedings of the ACS Symposium on Macro- and Microemulsions; American Chemical Society: Washington, DC, 1985, p 41.
4. (b) Wan, L. S. C. J. Pharm. Sci. 1966, 55, 1395.
5. (c) Gravsholt, S. J. Colloid Interface Sci. 1976, 57, 575.
6. (d) Ulmius, J.; Wennerström, H.; Johansson, L. B.-Å.; Lindblom, G.; Gravsholt, S. J. Phys. Chem. 1979, 83, 2232.
7. (e) Imae, T.; Kohsaka, T. J. Phys. Chem. 1992, 96, 10030.
8. (f) Shikata, T.; Hirata, H. Langmuir 1987, 3, 1081.
9. (g) Shikata, T.; Hirata, H.; Kotaka, T. Langmuir 1988, 4, 354.
10. (h) Lin, M. Y.; Hanley, H. J. M.; Sinha, S. K.; Straty, G. C.; Peiffer, D. G.; Kim, M. W. Phys. Rev. E 1996, 53, R4302.
11. (i) Soltero, J. F. A.; Puig, J. E. Langmuir 1996, 12, 2654.
12. (j) Brown, W.; Johansson, K.; Almgren, M. J. Phys. Chem. 1989, 93, 5888.
13. (k) Hassan, P. A.; Valaulikar, B. S.; Manohar, C.; Kern, F.; Bourdieu, L.; Candau, S. Langmuir 1996, 12, 4350.
14. Mendes, E.; Narayanan, J.; Oda, R.; Kern, F.; Candau, S. J.; Manohar, C. Langmuir 1997, 13, 2256.
15. Narayanan, J.; Manohar, C.; Kern, F.; Lequeux, F.; Candau, S. J. Langmuir 1997, 13, 5235.
16. (n) Hassan, P. A.; Candau, S. J.; Kern, F.; Manohar, C. Langmuir 1997, 14, 66025.
17. (a) Cates, M. W.; Candau, S. J. J. Phys.: Condens. Matter 1990, 2, 6869.
18. (b) Magid, L. J. J. Phys. Chem. B 1998, 102, 4064.
19. Magid, L. J.; Han, Z.; Warr, G. G.; Cassidy, M. A.; Butler, P. D.; Hamilton, W. A. J. Phys. Chem. B 1997, 101, 7917.
20. Imae, T.; Ikeda, S. Colloid Polym. Sci. 1987, 265, 1090.
21. (a) Safran, S.; Pincus, P.; Cates, M. E.; Mackintosh, F. J. Phys. (Paris) 1990, 51, 503.
22. (b) Mackintosh, F.; Safran, S.; Pincus, P. Europhys. Lett. 1990, 12, 697.
23. Magid, L. J.; Han, Z.; Li, Z.; Butler, P. D. Langmuir 2000, 16, 149.
24. (a) Pedersen, J. S.; Schurtenberger, P. Macromolecules 1996, 29, 7602.
25. (b) Pedersen, J. S.; Laso, M.; Schurtenberger, P. Phys. Rev. E 1996, 54, R5917.
26. Jerke, G.; Pedersen, J. S.; Egelhaaf, S. U.; Schurtenberger, S. Phys. Rev. E 1997, 56, 5772.
27. Identification of certain equipment or materials does not imply recommendation by NIST.
28. Details may be found in Quirion, F.; Magid, L. J. J. Phys. Chem. 1986, 90, 5435.
29. Details of the instruments may be found at http://rrdjazz.nist.gov/ chrnsans.html.
30. Koehler, W. C. Physica (Utrecht) 1986, 137B, 320.
31. (a) Pedersen, J. S. Adv. Colloid Interface Sci. 1997, 70, 171.
32. (b) Barker, J. G.; Pedersen, J. S. J. Appl. Crystallogr. 1995, 28, 105.
33. For the form factor, see Fournet, G. Bull. Soc. Fr. Mineral. Cristallogr. 1951, 74, 39.
34. (a) Tausk, R. J. M.; Overbeek, J. Th. G. J. Colloid Interface Sci. 1976, 2, 379.
35. (b) Mazer, N. A.; Benedek, G. B.; Carey, M. C. J. Phys. Chem. 1976, 80, 1075.
36. (c) Missel, P. J.; Mazer, N. A.; Benedek, G. B.; Young, C. Y.; Carey, M. C. J. Phys. Chem. 1980, 84, 1044.
37. Lin, T.-L.; Chen, S.-H.; Gabriel, N. E.; Roberts, M. F. J. Phys. Chem. 1987, 91, 406.
38. Casassa, E. F. J. Chem. Phys. 1955, 23, 596.
39. Holtzer, A. J. Polym. Sci.1955, 17, 433.
40. (a) Schmidt, M.; Paradossi, G.; Burchard, W. Makromol. Chem., Rapid Commun. 1985, 6, 767.
41. (b) Denkinger, P.; Burchard, W. J. Polym. Sci., Part B: Polym. Phys. 1991, 29, 589.
42. Pedersen, J. S.; Schurtenberger, P. J. Appl. Crystallogr. 1996, 29, 646.
43. (a) Schulz, G. V. Z. Phys. Chem., Abt. B 1939, 43, 25.
44. (b) Zimm, B. H. J. Chem. Phys. 1948, 16, 1099.
45. (a) Schurtenberger, P.; Jerke, G.; Egelhaaf, S. U.; Pedersen, J. S. Presented at the 71st ACS Colloid and Surface Science Symposium, Newark, DE, June 1997.
46. (b) Pedersen, J. S.; Schurtenberger, P. S. Europhys. Lett. 1999, 45, 666.
47. Ohta, T.; Oono, Y. Phys. Lett. 1982, 89A, 460.
48. The penetration factor, Ψ, can be obtained from Huber, K.; Stockmayer, W. H. Macromolecules 1987, 20, 1400.
49. Schurtenberger, P.; Cavaco, C. J. Phys. II 1993, 3, 1279.
50. Recall that the micellar contour length and molecular weight are related by the number of surfactant monomers per unit length; see ref 8 for determination of this structural parameter.
51. Bergström, M.; Pedersen, J. S. Phys. Chem. Chem. Phys. 1999, 1, 4437.
52. Jerke, G.; Pedersen, J. S.; Egelhaaf, S. U.; Schurtenberger, P. Langmuir 1998, 14, 6013.
53. Cassidy, M. A.; Warr, G. G. J. Phys. Chem. 1996, 100, 3237.
54. Schurtenberger, P.; Cavaco, C.; Tiberg, F.; Regev, O. Langmuir 1996, 12, 2894.
55. w for these micelles are not found in Figure 9 because the measured scattering curves do not go to sufficiently low Q. However, qualitative information about the micellar size can still be gained; see ref 8.
56. May, S.; Bohbot, Y.; Ben-Shaul, A. J. Phys. Chem. B 1997, 101, 8648.
57. i is the inflection point in the bending rod plot.
58. Imae, T.; Ikeda, S. J. Phys. Chem. 1986, 90, 5216.
59. Imae, T. J. Phys. Chem. 1990, 94, 5953.
60. Appell, J.; Bassereau, P.; Marignan, J.; Porte, G. Prog. Colloid Polym. Sci. 1990, 81, 13.
61. Kalus, J.; Hoffmann, H.; Reizlein, K.; Ulbricht, W.; Ibel, K. Ber. Bunsen-Ges. Phys. Chem. 1982, 86, 37.
62. For an example, see Gamez-Corrales, R.; Berret, J.-F.; Walker, L. M.; Oberdisse, J. Langmuir 1999, 15, 6755, in which a persistence length of 38 nm was determined for 9 mM CTA tosylate/0.2 M NaCl.
63. May, S.; Ben-Shaul, A. J. Chem. Phys. 1995, 103, 3839.
64. Safinya, C. R.; Sirota, E. B.; Roux, D.; Smith, G. S. Phys. Rev. Lett. 1989, 62, 1134.
65. Auguste, F.; Barois, P.; Fredon, L.; Clin, B.; Dufourc, E. J.; Bellocq, A. M. J. Phys. II 1994, 4, 2197.
66. Schomäcker, R.; Strey, R. J. Phys. Chem. 1994, 98, 3908.