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Volumn 18, Issue 4 II, 2000, Pages 1998-2002

Sputtered coatings for microfluidic applications

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC INSULATORS; SPUTTER DEPOSITION; SURFACE ROUGHNESS;

EID: 0034225712     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.582461     Document Type: Article
Times cited : (3)

References (12)
  • 6
    • 0003817360 scopus 로고    scopus 로고
    • Klewer, Dordrecht
    • See, for example, Micro Total Analysis Systems '98, edited by D. J. Harrison and A. van den Berg (Klewer, Dordrecht, 1998); Design Test, and Microfabrication of MEMS and MOEMS, edited by B. Courtois et al. (SPIE, 1999), Vol. 3680; Process Miniaturization 2nd International Conference on Microreaction Technology, edited by W. Ehrfeld, I. H. Rinard, and R. S. Wegeng (AIChE, 1998); Microfluidic Devices and Systems II, edited by C. H. Ahn and A. B. Frazier (SPIE, 1999), Vol. 3877; Microreaction Technology; Industrial Prospects, edited by W. Ehrfeld (Springer, New York, 2000).
    • (1998) Micro Total Analysis Systems '98
    • Harrison, D.J.1    Van Den Berg, A.2
  • 7
    • 0007128069 scopus 로고    scopus 로고
    • SPIE
    • See, for example, Micro Total Analysis Systems '98, edited by D. J. Harrison and A. van den Berg (Klewer, Dordrecht, 1998); Design Test, and Microfabrication of MEMS and MOEMS, edited by B. Courtois et al. (SPIE, 1999), Vol. 3680; Process Miniaturization 2nd International Conference on Microreaction Technology, edited by W. Ehrfeld, I. H. Rinard, and R. S. Wegeng (AIChE, 1998); Microfluidic Devices and Systems II, edited by C. H. Ahn and A. B. Frazier (SPIE, 1999), Vol. 3877; Microreaction Technology; Industrial Prospects, edited by W. Ehrfeld (Springer, New York, 2000).
    • (1999) Design Test, and Microfabrication of MEMS and MOEMS , vol.3680
    • Courtois, B.1
  • 8
    • 0007027711 scopus 로고    scopus 로고
    • AIChE
    • See, for example, Micro Total Analysis Systems '98, edited by D. J. Harrison and A. van den Berg (Klewer, Dordrecht, 1998); Design Test, and Microfabrication of MEMS and MOEMS, edited by B. Courtois et al. (SPIE, 1999), Vol. 3680; Process Miniaturization 2nd International Conference on Microreaction Technology, edited by W. Ehrfeld, I. H. Rinard, and R. S. Wegeng (AIChE, 1998); Microfluidic Devices and Systems II, edited by C. H. Ahn and A. B. Frazier (SPIE, 1999), Vol. 3877; Microreaction Technology; Industrial Prospects, edited by W. Ehrfeld (Springer, New York, 2000).
    • (1998) Process Miniaturization 2nd International Conference on Microreaction Technology
    • Ehrfeld, W.1    Rinard, I.H.2    Wegeng, R.S.3
  • 9
    • 0007080640 scopus 로고    scopus 로고
    • SPIE
    • See, for example, Micro Total Analysis Systems '98, edited by D. J. Harrison and A. van den Berg (Klewer, Dordrecht, 1998); Design Test, and Microfabrication of MEMS and MOEMS, edited by B. Courtois et al. (SPIE, 1999), Vol. 3680; Process Miniaturization 2nd International Conference on Microreaction Technology, edited by W. Ehrfeld, I. H. Rinard, and R. S. Wegeng (AIChE, 1998); Microfluidic Devices and Systems II, edited by C. H. Ahn and A. B. Frazier (SPIE, 1999), Vol. 3877; Microreaction Technology; Industrial Prospects, edited by W. Ehrfeld (Springer, New York, 2000).
    • (1999) Microfluidic Devices and Systems II , vol.3877
    • Ahn, C.H.1    Frazier, A.B.2
  • 10
    • 0003396561 scopus 로고    scopus 로고
    • Springer, New York
    • See, for example, Micro Total Analysis Systems '98, edited by D. J. Harrison and A. van den Berg (Klewer, Dordrecht, 1998); Design Test, and Microfabrication of MEMS and MOEMS, edited by B. Courtois et al. (SPIE, 1999), Vol. 3680; Process Miniaturization 2nd International Conference on Microreaction Technology, edited by W. Ehrfeld, I. H. Rinard, and R. S. Wegeng (AIChE, 1998); Microfluidic Devices and Systems II, edited by C. H. Ahn and A. B. Frazier (SPIE, 1999), Vol. 3877; Microreaction Technology; Industrial Prospects, edited by W. Ehrfeld (Springer, New York, 2000).
    • (2000) Microreaction Technology; Industrial Prospects
    • Ehrfeld, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.