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Volumn 13, Issue 7, 2000, Pages 1011-1016
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Microstructure homogeneity study on Bi2223 multifilamentary tapes by micro-x-ray diffraction
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Author keywords
[No Author keywords available]
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Indexed keywords
CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY);
ELECTRIC WIRE;
HEAT TREATMENT;
HIGH TEMPERATURE SUPERCONDUCTORS;
TEXTURES;
X RAY DIFFRACTION ANALYSIS;
MICRO X RAY DIFFRACTION SYSTEM;
MULTIFILAMENTARY TAPE;
PHASE CONVERSION;
PHASE FORMATION;
SUPERCONDUCTING FILMS;
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EID: 0034225179
PISSN: 09532048
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-2048/13/7/318 Document Type: Article |
Times cited : (4)
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References (15)
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