A study of vacancy-related defects in (pb,la)(zr,ti)o3 thin films using positron annihilation

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 47, Issue 4, 2000, Pages 916-920

  Fhessnegg, Thomas ^a   Aggarwal, Sanjeev ^a   Nielsen, Brent ^a   Ramesh, Ramamoorthy ^a   Keeble, David J ^a   Poindcxtor, Edward H ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DOPING (ADDITIVES); DOPPLER EFFECT; FILM GROWTH; LEAD COMPOUNDS; THIN FILMS;

POSITRON ANNIHILATION;

FERROELECTRIC MATERIALS;

EID: 0034224577     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/58.852074     Document Type: Article

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