EBSD study on grain boundary characteristics in fine-grained Al alloys

Scripta Materialia

Volumn 43, Issue 3, 2000, Pages 213-220

  Huang, J C ^a   Hsiao, I C ^a   Wang, T D ^a   Lou, B Y ^a  

^a NATIONAL SUN YAT SEN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; ELECTROLYTIC POLISHING; ELECTRON DIFFRACTION; ELECTRON SCATTERING; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; OPTICAL RESOLVING POWER; SCANNING ELECTRON MICROSCOPY;

COINCIDENCE SITE LATTICE (CSL) BOUNDARIES; ELECTRON BACKSCATTERED DIFFRACTION (EBSD) ANALYSIS; HIGH ANGLE BOUNDARIES (HAB); LOW ANGLE BOUNDARIES (LAB); MECHANICAL POLISHING; MEDIUM ANGLE BOUNDARIES (MAB);

ALUMINUM ALLOYS;

EID: 0034224511     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(00)00393-6     Document Type: Article

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