A model for creep-fatigue interaction in terms of crack-tip stress relaxation

Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

Volumn 31, Issue 7, 2000, Pages 1761-1775

  Yong Jun, O H ^a   Nam, Soo Woo ^b   Hong, Jun Hwa ^a  

^a Korea Atomic Energy Research Institute   (South Korea)

^b Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CRACK PROPAGATION; CREEP; DEGRADATION; FATIGUE OF MATERIALS; FRACTURE MECHANICS; MATHEMATICAL MODELS; OPTICAL MICROSCOPY; SCANNING ELECTRON MICROSCOPY; SHEARING; STAINLESS STEEL; TENSILE STRESS; TRANSMISSION ELECTRON MICROSCOPY;

CRACK-TIP SHEARING PROCESS; CRACK-TIP STRESS RELAXATION; CREEP FATIGUE INTERACTION; FATIGUE CRACK GROWTH;

STRESS RELAXATION;

EID: 0034224375     PISSN: 10735623     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11661-998-0327-3     Document Type: Article

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