Construction and operation of a simple electronic speckle pattern interferometer and its use in measuring microscopic deformations

Optics and Laser Technology

Volumn 32, Issue 5, 2000, Pages 323-328

  Abedin, K M ^a   Jesmin, S A ^a   Haider, A F M Y ^a  

^a UNIVERSITY OF DHAKA   (Bangladesh)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; DEFORMATION; ELASTICITY; IMAGE ANALYSIS; MICROSCOPIC EXAMINATION; SPECKLE;

ELECTRONIC SPECKLE PATTERN INTERFEROMETERS; MICROSCOPIC DEFORMATIONS;

INTERFEROMETERS;

EID: 0034223289     PISSN: 00303992     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-3992(00)00074-8     Document Type: Article

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