-
1
-
-
0015007516
-
Speckle pattern and holographic techniques in engineering metrology
-
J. N. Butters and J. A. Leendertz, "Speckle pattern and holographic techniques in engineering metrology," Opt. Laser Technol. 3(1), 26-30 (1971).
-
(1971)
Opt. Laser Technol.
, vol.3
, Issue.1
, pp. 26-30
-
-
Butters, J.N.1
Leendertz, J.A.2
-
2
-
-
0016917119
-
Scan converter memory used in TV-speckle interferometry
-
O. J. Løkberg, O. M. Holje, and H. M. Pederson, "Scan converter memory used in TV-speckle interferometry," Opt. Laser Technol. 8(1), 17-20 (1976).
-
(1976)
Opt. Laser Technol.
, vol.8
, Issue.1
, pp. 17-20
-
-
Løkberg, O.J.1
Holje, O.M.2
Pederson, H.M.3
-
3
-
-
0019026885
-
Electronic speckle interferometry using digital image processing techniques
-
S. Nakadate, T. Yatagai, and H. Saito, "Electronic speckle interferometry using digital image processing techniques," Appl. Opt. 19(11), 1879-1883 (1980).
-
(1980)
Appl. Opt.
, vol.19
, Issue.11
, pp. 1879-1883
-
-
Nakadate, S.1
Yatagai, T.2
Saito, H.3
-
4
-
-
0020133917
-
Use of electronic speckle pattern interferometry (ESPI) in the measurement of static and dynamic surface displacements
-
C. Wykes, "Use of electronic speckle pattern interferometry (ESPI) in the measurement of static and dynamic surface displacements," Opt. Eng. 21(3), 400-405 (1982).
-
(1982)
Opt. Eng.
, vol.21
, Issue.3
, pp. 400-405
-
-
Wykes, C.1
-
5
-
-
0021517826
-
Electronic speckle pattern interferometry with a microcomputer
-
B. F. Oreb, B. Sharon, and P. Hariharan, "Electronic speckle pattern interferometry with a microcomputer," Appl. Opt. 23(22), 3940-3941 (1984).
-
(1984)
Appl. Opt.
, vol.23
, Issue.22
, pp. 3940-3941
-
-
Oreb, B.F.1
Sharon, B.2
Hariharan, P.3
-
6
-
-
0022025999
-
Mapping of in-plane vibration modes by electronic speckle pattern interferometry
-
O. J. Løkberg, "Mapping of in-plane vibration modes by electronic speckle pattern interferometry," Opt. Eng. 24(2), 356-359 (1985).
-
(1985)
Opt. Eng.
, vol.24
, Issue.2
, pp. 356-359
-
-
Løkberg, O.J.1
-
8
-
-
0025464768
-
Electronic speckle pattern interferometry system for in situ deformation monitoring of buildings
-
G. Gülker, K. Hinsch, C. Holscher, A. Kramer, and H. Neunaber, "Electronic speckle pattern interferometry system for in situ deformation monitoring of buildings," Opt. Eng. 29(7), 816-820 (1990).
-
(1990)
Opt. Eng.
, vol.29
, Issue.7
, pp. 816-820
-
-
Gülker, G.1
Hinsch, K.2
Holscher, C.3
Kramer, A.4
Neunaber, H.5
-
9
-
-
0030386188
-
Large deformation measurements using ESPI
-
K. Tenjimbayashi, "Large deformation measurements using ESPI," Proc. SPIE 2888, 126-133 (1996).
-
(1996)
Proc. SPIE
, vol.2888
, pp. 126-133
-
-
Tenjimbayashi, K.1
-
10
-
-
0031060028
-
Electronic speckle pattern interferometry applied to the study and conservation of paintings
-
A. C. Lucia, P. M. Zanetta, and M. Facchini, "Electronic speckle pattern interferometry applied to the study and conservation of paintings," Opt. Lasers Eng. 26(2-3), 221-233 (1997).
-
(1997)
Opt. Lasers Eng.
, vol.26
, Issue.2-3
, pp. 221-233
-
-
Lucia, A.C.1
Zanetta, P.M.2
Facchini, M.3
-
11
-
-
0026191118
-
JPEG still picture compression algorithm
-
A. Léger, T. Omachi, and G. K. Wallace, "JPEG still picture compression algorithm," Opt. Eng. 30(7), 947-954 (1991).
-
(1991)
Opt. Eng.
, vol.30
, Issue.7
, pp. 947-954
-
-
Léger, A.1
Omachi, T.2
Wallace, G.K.3
|