|
|
Volumn 80, Issue 6, 2000, Pages 395-400
|
|
Use of electron channelling contrast imaging to assess near-surface mechanical damage
|
|
Author keywords
[No Author keywords available]
|
|
Indexed keywords
CRYSTAL DEFECTS;
CRYSTAL ORIENTATION;
CRYSTAL STRUCTURE;
ELECTROLYTIC POLISHING;
INTERMETALLICS;
NICKEL ALLOYS;
SINGLE CRYSTALS;
SURFACES;
ELECTRON CHANNELLING CONTRAST IMAGING;
MECHANICAL POLISHING;
NEAR SURFACE MECHANICAL DAMAGE;
SURFACE QUALITY;
SCANNING ELECTRON MICROSCOPY;
|
|
EID: 0034211162
PISSN: 09500839
EISSN: None
Source Type: Journal
DOI: 10.1080/095008300403530 Document Type: Article |
|
Times cited : (7)
|
|
References (8)
|
