Investigation of nonswitching regions in ferroelectric thin films using scanning force microscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 39, Issue 6 B, 2000, Pages 3799-3803

  Saya, Yuko ^a,b   Watanabe, Shunji ^a   Kawai, Maki ^a,b   Yamada, Hirofumi ^c   Matsushige, Kazumi ^c  

^a INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

^b TOKYO UNIVERSITY OF SCIENCE   (Japan)

^c KYOTO UNIVERSITY   (Japan)

Author keywords

Epitaxial; Ferroelectric thin films; Lattice misfit; Lead zirconate titanate; Nonswitching regions; Pulsed laser deposition; Scanning probe microscope; YBa2Cu3O7

Indexed keywords

CRYSTAL LATTICES; CRYSTAL ORIENTATION; DEPOSITION; ELECTRODES; EPITAXIAL GROWTH; FERROELECTRIC MATERIALS; LEAD COMPOUNDS; MICROSCOPIC EXAMINATION; PULSED LASER APPLICATIONS; STRONTIUM COMPOUNDS; THIN FILMS; YTTRIUM BARIUM COPPER OXIDES;

LATTICE MISMATCH; LEAD ZIRCONATE TITANATE; PULSED LASER DEPOSITION (PLD); SCANNING PROBE MICROSCOPY; STRONTIUM TITANATE;

DIELECTRIC FILMS;

EID: 0034206918     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.3799     Document Type: Article

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