Bayesian graph edit distance

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 22, Issue 6, 2000, Pages 628-635

  Myers, Richard ^a,b   Wilson, Richard C ^a   Hancock, Edwin R ^a  

^a UNIVERSITY OF YORK   (United Kingdom)

^b Praxis Critical Systems Limited   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COMPLEXITY; ERROR ANALYSIS; IMAGE ANALYSIS; IMAGE QUALITY; PROBABILITY DISTRIBUTIONS; STATISTICAL METHODS;

BAYESIAN GRAPHS; GRAPH-MATCHING ALGORITHMS; LEVENSHTEIN DISTANCE;

PATTERN MATCHING;

EID: 0034205923     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/34.862201     Document Type: Article

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