A Distance Measure Between Attributed Relational Graphs for Pattern Recognition

IEEE Transactions on Systems, Man and Cybernetics

Volumn SMC-13, Issue 3, 1983, Pages 353-362

  Sanfeliu, Alberto ^a,b   Fu, King Sun ^a  

^a PURDUE UNIVERSITY   (United States)

^b CSIC Instituto de Cibernetica de Barcelona   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

GRAPHIC METHODS;

PATTERN RECOGNITION;

EID: 0020752197     PISSN: 00189472     EISSN: 21682909     Source Type: Journal    
DOI: 10.1109/TSMC.1983.6313167     Document Type: Article

References (27)

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