Effect of stress on the microwave dielectric properties of Ba0.5Sr0.5TiO3 thin films

Journal of Electroceramics

Volumn 4, Issue 2, 2000, Pages 357-363

  Horwitz, James S ^a   Chang, Wontae ^a   Kim, Wonjeong ^a   Qadri, Syed B ^a   Pond, Jeffrey M ^a   Kirchoefer, Steven W ^a   Chrisey, Douglas B ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM COMPOUNDS; DIELECTRIC LOSSES; ELECTRIC FIELD EFFECTS; LANTHANUM COMPOUNDS; MAGNESIA; PERMITTIVITY; PULSED LASER APPLICATIONS; STRAIN; STRESSES; TEMPERATURE; THERMAL EXPANSION; X RAY DIFFRACTION ANALYSIS;

BARIUM STRONTIUM TITANATE; FILM STRESS; LATTICE MISMATCH; POST DEPOSITION ANNEAL; THIN AMORPHOUS BUFFER LAYER;

DIELECTRIC FILMS;

EID: 0034204819     PISSN: 13853449     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1009974929096     Document Type: Article

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