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Volumn 10, Issue 2, 2001, Pages 89-96

Flip chip on FR-4, ceramics and flex

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; ELECTRIC CONDUCTIVITY; ELECTRON DEVICE TESTING; FLIP CHIP DEVICES; INDUSTRIAL ELECTRONICS; SUBSTRATES;

EID: 0034197002     PISSN: 09603131     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0960313100000095     Document Type: Article
Times cited : (16)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.