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Volumn 7, Issue 4, 1997, Pages 287-292
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Reliability testing on flip chip joining with isotropically-conductive adhesives
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0004734419
PISSN: 09603131
EISSN: None
Source Type: Journal
DOI: 10.1142/S0960313197000300 Document Type: Article |
Times cited : (3)
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References (4)
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