Kinetics of light-induced degradation in a-Si:H films investigated by computer simulation

Semiconductors

Volumn 34, Issue 6, 2000, Pages 717-722

  Meytin, M N ^a   Zeman, M ^b   Budaguan, B G ^a   Metselaar, J W ^b  

^a NATIONAL RESEARCH UNIVERSITY OF ELECTRONIC TECHNOLOGY   (Russian Federation)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0034196234     PISSN: 10637826     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1188060     Document Type: Article

References (13)

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