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Volumn 17, Issue 5, 2000, Pages
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Noncontact full-field strain measurement with 3D ESPI
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Author keywords
[No Author keywords available]
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Indexed keywords
FINITE ELEMENT METHOD;
HIGH SPEED CAMERAS;
HOLOGRAPHIC INTERFEROMETRY;
LASER APPLICATIONS;
MATHEMATICAL MODELS;
SEMICONDUCTOR LASERS;
THREE DIMENSIONAL;
ESPI CAMERA;
HIGH SPEED COMPUTING;
POWERFUL INSPECTION TECHNOLOGY;
VIDEO TECHNOLOGY;
STRAIN MEASUREMENT;
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EID: 0034190905
PISSN: 07469462
EISSN: None
Source Type: Trade Journal
DOI: None Document Type: Article |
Times cited : (24)
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References (12)
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