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Volumn 57, Issue 6, 1999, Pages 576-581
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Noncontact total strain measurement for failure prediction
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Author keywords
[No Author keywords available]
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Indexed keywords
FAILURE ANALYSIS;
HOLOGRAPHIC INTERFEROMETRY;
LIFE CYCLE;
LOAD TESTING;
SPECKLE;
STRAIN GAGES;
STRAIN MEASUREMENT;
STRESS ANALYSIS;
STRESS CONCENTRATION;
VIBRATIONS (MECHANICAL);
ELECTRONIC SPECKLE PATTERN INTERFEROMETRY (ESPI) SYSTEMS;
NONDESTRUCTIVE EXAMINATION;
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EID: 0032678031
PISSN: 00255327
EISSN: None
Source Type: Trade Journal
DOI: None Document Type: Article |
Times cited : (3)
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References (11)
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