|
Volumn 80, Issue 5, 2000, Pages 317-324
|
A molecular dynamics study of atom mobility on steps of a Si(100) surface
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ATOMS;
COMPUTER SIMULATION;
LOW ENERGY ELECTRON DIFFRACTION;
MOLECULAR DYNAMICS;
MORPHOLOGY;
TEMPERATURE;
ATOM MOBILITY;
STANDARD THREE BODY POTENTIALS;
SEMICONDUCTING SILICON;
|
EID: 0034190890
PISSN: 09500839
EISSN: None
Source Type: Journal
DOI: 10.1080/095008300176083 Document Type: Article |
Times cited : (6)
|
References (24)
|