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Volumn 78, Issue 2, 2000, Pages 206-221

Subpixel estimation of circle parameters using orthogonal circular detector

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTATIONAL COMPLEXITY; EDGE DETECTION; IMAGE SEGMENTATION; PARAMETER ESTIMATION;

EID: 0034188551     PISSN: 10773142     EISSN: None     Source Type: Journal    
DOI: 10.1006/cviu.2000.0836     Document Type: Article
Times cited : (16)

References (12)
  • 2
    • 0029271742 scopus 로고
    • Sub-pixel edge localization and the interpolation of still images
    • Jensen K., Anastassion D. Sub-pixel edge localization and the interpolation of still images. IEEE Trans. Image Process. 4:1995;285-295.
    • (1995) IEEE Trans. Image Process , vol.4 , pp. 285-295
    • Jensen, K.1    Anastassion, D.2
  • 6
    • 0030170173 scopus 로고    scopus 로고
    • Image fusion and subpixel parameter estimation for automated optical inspection of electronic components
    • Reed J. M., Hutchinson Seth. Image fusion and subpixel parameter estimation for automated optical inspection of electronic components. IEEE Trans. Indust. Electron. 43:1996;346-354.
    • (1996) IEEE Trans. Indust. Electron , vol.43 , pp. 346-354
    • Reed, J.M.1    Hutchinson Seth2
  • 8
    • 0024471180 scopus 로고
    • A simple approach for the estimation of circular arc center and its radius
    • Thomas S. M., Chan Y. T. A simple approach for the estimation of circular arc center and its radius. Comput. Vision Graphics Image Process. 45:1989;362-370.
    • (1989) Comput. Vision Graphics Image Process , vol.45 , pp. 362-370
    • Thomas, S.M.1    Chan, Y.T.2
  • 11
    • 0028463874 scopus 로고
    • On the location error of curved edges in low-pass filtered 2-D and 3-D images
    • Verbeek P. W., Vliet L. On the location error of curved edges in low-pass filtered 2-D and 3-D images. IEEE Trans. Pattern Anal. Mach. Intell. 16:1994;726-733.
    • (1994) IEEE Trans. Pattern Anal. Mach. Intell. , vol.16 , pp. 726-733
    • Verbeek, P.W.1    Vliet, L.2
  • 12
    • 0027663736 scopus 로고
    • A multi-scale edge detector
    • Ziou D., Tabbone S. A multi-scale edge detector. Pattern Recognition. 26:1993;1305-1314.
    • (1993) Pattern Recognition , vol.26 , pp. 1305-1314
    • Ziou, D.1    Tabbone, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.