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Volumn 452, Issue 1-3, 2000, Pages 58-66

Growth of ultrathin films of copper on polycrystalline ZrO2

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; FILM GROWTH; INTERFACES (MATERIALS); POLYCRYSTALLINE MATERIALS; ULTRATHIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY; ZIRCONIA;

EID: 0034188430     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00326-5     Document Type: Article
Times cited : (11)

References (39)
  • 5
    • 0021601039 scopus 로고
    • J.R. Anderson, Boudart M. Berlin: Springer
    • Foger K. Anderson J.R., Boudart M. Catalysis. Science and Technology. Vol. 6:1984;227-305 Springer, Berlin.
    • (1984) Catalysis. Science and Technology , vol.6 , pp. 227-305
    • Foger, K.1
  • 37
    • 0000884284 scopus 로고
    • Work Function Measurements and Results
    • New York: Marcel Dekker
    • Riviere J.C. Work Function Measurements and Results. Solid State Surface Science. Vol. 1:1969;275 Marcel Dekker, New York.
    • (1969) Solid State Surface Science , vol.1 , pp. 275
    • Riviere, J.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.