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Volumn 408, Issue 1-3, 1998, Pages 182-189

An XPS and XAES study of the Ni/ZrO2 interface

Author keywords

Growth mode; Interface; Nickel; X ray photoelectron spectroscopy; Zirconia

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CHARGE TRANSFER; DEPOSITION; NICKEL; THERMAL EFFECTS; X RAY PHOTOELECTRON SPECTROSCOPY; ZIRCONIA;

EID: 0032097132     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)00219-2     Document Type: Article
Times cited : (40)

References (31)
  • 5
    • 0021601039 scopus 로고
    • J.R. Anderson, M. Boudart (Eds.), Springer, Berlin
    • K. Foger, in: J.R. Anderson, M. Boudart (Eds.), Catalysis. Science and Technology, Vol. 6, Springer, Berlin, 1984 pp. 227-305.
    • (1984) Catalysis. Science and Technology , vol.6 , pp. 227-305
    • Foger, K.1
  • 21
    • 0346819733 scopus 로고
    • PhD thesis, J. Fourier University of Grenoble I
    • D.B.B. Lollman, PhD thesis, J. Fourier University of Grenoble I, 1995.
    • (1995)
    • Lollman, D.B.B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.