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Volumn 408, Issue 1-3, 1998, Pages 182-189
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An XPS and XAES study of the Ni/ZrO2 interface
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Author keywords
Growth mode; Interface; Nickel; X ray photoelectron spectroscopy; Zirconia
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Indexed keywords
AUGER ELECTRON SPECTROSCOPY;
CHARGE TRANSFER;
DEPOSITION;
NICKEL;
THERMAL EFFECTS;
X RAY PHOTOELECTRON SPECTROSCOPY;
ZIRCONIA;
STRANSKI-KRASTANOV PROCESS;
X RAY INDUCED AUGER ELECTRON SPECTROSCOPY (XAES);
INTERFACES (MATERIALS);
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EID: 0032097132
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(98)00219-2 Document Type: Article |
Times cited : (40)
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References (31)
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