Magnetization distribution of 180°C domain walls at the surface of 3% Si-Fe sheets

Journal of Magnetism and Magnetic Materials

Volumn 213, Issue 3, 2000, Pages 281-292

  Anilturk, O S ^a   Koymen, A R ^a  

^a UNIVERSITY OF TEXAS AT ARLINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; CRYSTALLIZATION; MAGNETIC ANISOTROPY; MAGNETISM; MAGNETIZATION; MICROSTRUCTURE; POLARIZATION; SCANNING ELECTRON MICROSCOPY; SILICON ALLOYS;

BLOCH WALL; SECONDARY ELECTRON SPIN POLARIZATION; SURFACE MAGNETIC MICROSTRUCTURE; SURFACE MAGNETISM; TERTIARY RECRYSTALLIZATION;

MAGNETIC DOMAINS;

EID: 0034188232     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(99)00845-8     Document Type: Article

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