|
Volumn 38, Issue 9, 1998, Pages 1365-1369
|
Study on surface magnetic domain structure of thin-gauged 3% Si-Fe strips using scanning electron microscope with polarization analyzer
a a b c d
d
POSCO
(South Korea)
|
Author keywords
[No Author keywords available]
|
Indexed keywords
POLARIZATION ANALYZER;
REDUCTION RATIO PER PASS;
THIN GAUGED STRIP;
COLD ROLLING;
MAGNETIC DOMAINS;
MAGNETIC PROPERTIES;
MAGNETIC VARIABLES MEASUREMENT;
MAGNETIZATION;
MICROSTRUCTURE;
OPTICAL MICROSCOPY;
SCANNING ELECTRON MICROSCOPY;
SILICON ALLOYS;
STRIP METAL;
TEXTURES;
X RAY DIFFRACTION;
SURFACE STRUCTURE;
|
EID: 0032478379
PISSN: 13596462
EISSN: None
Source Type: Journal
DOI: 10.1016/S1359-6462(98)00061-X Document Type: Article |
Times cited : (1)
|
References (6)
|