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Volumn 38, Issue 9, 1998, Pages 1365-1369

Study on surface magnetic domain structure of thin-gauged 3% Si-Fe strips using scanning electron microscope with polarization analyzer

Author keywords

[No Author keywords available]

Indexed keywords

POLARIZATION ANALYZER; REDUCTION RATIO PER PASS; THIN GAUGED STRIP;

EID: 0032478379     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(98)00061-X     Document Type: Article
Times cited : (1)

References (6)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.