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Volumn 27, Issue 5, 2000, Pages 373-376
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Transport in split-gate silicon quantum dots
a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
CRYOSTATS;
ELECTRIC CONDUCTANCE;
ELECTRIC CURRENT MEASUREMENT;
ELECTRON ENERGY LEVELS;
ELECTRON TRANSPORT PROPERTIES;
ELECTRONIC STRUCTURE;
GATES (TRANSISTOR);
MOSFET DEVICES;
SEMICONDUCTING SILICON;
SUPERFLUID HELIUM;
COULOMB CHARGING ENERGY;
SPLIT-GATE SILICON QUANTUM DOTS;
SEMICONDUCTOR QUANTUM DOTS;
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EID: 0034187964
PISSN: 07496036
EISSN: None
Source Type: Journal
DOI: 10.1006/spmi.2000.0844 Document Type: Article |
Times cited : (5)
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References (8)
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