Characteristics of sol-gel SnO2 films treated by ammonia

Journal of Sol-Gel Science and Technology

Volumn 18, Issue 2, 2000, Pages 159-166

  Gu, Zhengtian ^a   Liang, Peihui ^a   Liu, Xiaolin ^a   Zhang, Weiqing ^a   Le, Yueqin ^a  

^a SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ADHESION; AMMONIA; COATING TECHNIQUES; CONDENSATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; LIGHT REFLECTION; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING TIN COMPOUNDS; SOL-GELS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

DIP COATING;

SEMICONDUCTING FILMS;

EID: 0034187490     PISSN: 09280707     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1008769020768     Document Type: Article

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