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Volumn 36, Issue 16, 1997, Pages 3788-3792

Determination of the parameters of surface layers on glasses by p-polarized reflectances

Author keywords

Glass; P polarized light; Reflectance ratio; Surface layer

Indexed keywords


EID: 0001713753     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.36.003788     Document Type: Article
Times cited : (11)

References (9)
  • 1
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    • Ellipso-metric study of polished glass surfaces
    • H. Yokota, H. Sakata, M. Nishibori, and K. Kinsita, “Ellipso-metric study of polished glass surfaces,” Surf. Sci. 16, 265-274 (1969).
    • (1969) Surf. Sci. , vol.16 , pp. 265-274
    • Yokota, H.1    Sakata, H.2    Nishibori, M.3    Kinsita, K.4
  • 2
    • 0343152483 scopus 로고
    • Ellipsometrische bestimmung von oberflachen-schiten auf polierten optischen glasern
    • K. Neumann, “Ellipsometrische bestimmung von oberflachen-schiten auf polierten optischen glasern,” Opt. Acta 30, 967-980 (1983).
    • (1983) Opt. Acta , vol.30 , pp. 967-980
    • Neumann, K.1
  • 3
    • 0028510832 scopus 로고
    • Optical profile of surface layers on a float glass determined by ellipsometry
    • B. Dugnoille and O. Virlet, “Optical profile of surface layers on a float glass determined by ellipsometry,” Appl. Opt. 33, 5853-5858 (1994).
    • (1994) Appl. Opt. , vol.33 , pp. 5853-5858
    • Dugnoille, B.1    Virlet, O.2
  • 4
    • 0000476806 scopus 로고
    • Determination of the optical functions of transparent glasses by using spectroscopic ellip-sometry
    • G. E. Jellison, Jr. and B. C. Sales, “Determination of the optical functions of transparent glasses by using spectroscopic ellip-sometry,” Appl. Opt. 30, 4310-4315 (1991).
    • (1991) Appl. Opt , vol.30 , pp. 4310-4315
    • Jellison, G.E.1    Sales, B.C.2
  • 5
    • 0010055356 scopus 로고
    • Determination of the damaged-layer parameters and the degree of the polished-surface contamination for transparent materials
    • A. G. Afanaseva, O. F. Gavrilenko, N. P. Matshina, and E. A. Nesmelov, “Determination of the damaged-layer parameters and the degree of the polished-surface contamination for transparent materials,” Opt. Spectrosc. (USSR) 69, 679-682 (1990).
    • (1990) Opt. Spectrosc. (USSR) , vol.69 , pp. 679-682
    • Afanaseva, A.G.1    Gavrilenko, O.F.2    Matshina, N.P.3    Nesmelov, E.A.4
  • 7
    • 0003972070 scopus 로고
    • Pergamon, New York, Chap. 1
    • M. Born and E. Wolf, Principles of Optics (Pergamon, New York, 1975), Chap. 1, pp. 36-50.
    • (1975) Principles of Optics , pp. 36-50
    • Born, M.1    Wolf, E.2
  • 9
    • 0028403720 scopus 로고
    • Design of a scanning ellipsometer by synchronous rotation of the polarizer and analyzer
    • L. Y. Chen, X. W. Feng, Y. Su, H. Z. Ma, and Y. H. Qian, “Design of a scanning ellipsometer by synchronous rotation of the polarizer and analyzer,” Appl. Opt. 33, 1299-1305 (1994).
    • (1994) Appl. Opt. , vol.33 , pp. 1299-1305
    • Chen, L.Y.1    Feng, X.W.2    Su, Y.3    Ma, H.Z.4    Qian, Y.H.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.