Quantum-dot structures measuring Hamming distance for associative memories

Superlattices and Microstructures

Volumn 27, Issue 5, 2000, Pages 613-616

  Morie, Takashi ^a   Matsuura, Tomohiro ^a   Miyata, Satoshi ^a   Yamanaka, Toshio ^a   Nagata, Makoto ^a   Iwata, Atsushi ^a  

^a HIROSHIMA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ASSOCIATIVE STORAGE; COMPUTER SIMULATION; GATES (TRANSISTOR); MONTE CARLO METHODS; MOSFET DEVICES; SEMICONDUCTOR STORAGE;

COULOMB REPULSION EFFECTS; HAMMING DISTANCE;

SEMICONDUCTOR QUANTUM DOTS;

EID: 0034187148     PISSN: 07496036     EISSN: None     Source Type: Journal    
DOI: 10.1006/spmi.2000.0874     Document Type: Article

References (4)

1. Shimano S., Masu K., Tsubouchi K. Jpn. J. Appl. Phys. 38:1999;403.
2. Chen R. H., Korotkov A. N., Likharev K. K. Appl. Phys. Lett. 68:1996;1954.
3. Saen M., Morie T., Nagata M., Iwata A. IEICE Trans. Electron. E81-C:1998;30.
4. Yamanaka T., Morie T., Nagata M., Iwata A. Ext. Abs. of Int. Conference on Solid State Devices and Materials. Japan Society of Applied Physics, Hiroshima, Japan, 1998;190.