A stochastic associative memory using single-electron tunneling devices

IEICE Transactions on Electronics

Volumn E81-C, Issue 1, 1998, Pages 30-34

  Saen, Makoto ^a  

^a HIROSHIMA UNIVERSITY   (Japan)

Author keywords

Associative memory; SET; Single electron transistor; Single electron tunneling

Indexed keywords

COMPUTER SIMULATION; ELECTRON TUNNELING; RANDOM PROCESSES; SEMICONDUCTOR DEVICE MODELS; TIME DOMAIN ANALYSIS; TRANSISTORS;

SINGLE ELECTRON TRANSISTORS;

ASSOCIATIVE STORAGE;

EID: 0031677761     PISSN: 09168524     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (11)

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