Emitter failure and thermal facet load in high-power laser diode arrays

Applied Physics A: Materials Science and Processing

Volumn 66, Issue 5, 1998, Pages 483-486

  Puchert, R ^a   Tomm, J W ^a   Jaeger, A ^a   Barwolff A ^a   Luft, J ^b   Spath W ^b  

^a MAX BORN INSTITUT   (Germany)

^b SIEMENS AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FINITE ELEMENT METHOD; HIGH POWER LASERS; SEMICONDUCTOR DEVICE MODELS; TEMPERATURE MEASUREMENT;

THERMAL FACET LOAD;

SEMICONDUCTOR LASERS;

EID: 0032072826     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390050700     Document Type: Article

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