High-resolution and low-voltage FE-SEM imaging and microanalysis in materials characterization

Materials Characterization

Volumn 44, Issue 4, 2000, Pages 353-363

  Liu, Jingyue ^a  

^a MONSANTO COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FIELD EMISSION MICROSCOPES; HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGE ANALYSIS; MICROANALYSIS; SCANNING ELECTRON MICROSCOPY;

FIELD EMISSION SCANNING ELECTRON MICROSCOPY;

MATERIALS SCIENCE;

EID: 0034171410     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1044-5803(99)00076-5     Document Type: Article

References (8)

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4. Joy D.C. Monte Carlo Modeling for Electron Microscopy and Microanalysis. 1995;Oxford University Press, New York, NY.
5. Bongeler R., Golla U., Kassens M., Reimer L., Schindler B., Senkel R., Spranck M. Electron-specimen interactions in low-voltage scanning electron microscopy. Scanning. 15:1993;1-18.
6. Reimer L. Scanning Electron Microscopy. Physics of Image Formation and Microanalysis:1998;Springer-Verlag, Berlin.
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8. Joy D.C. The efficiency of X-ray production at low energies. J. Microsc. 191:1998;74-82.