Characterization of polycrystalline gradient thin film by X-ray diffraction method

Chinese Physics

Volumn 9, Issue 4, 2000, Pages 284-289

  Li, Bin ^a   Tao, Kun ^a   Liu, Xing Tao ^a   Miao, Wei ^a   Feng, Tao ^a   Yang, Ning ^a   Liu, Bai Xin ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0034165568     PISSN: 10091963     EISSN: None     Source Type: Journal    
DOI: 10.1088/1009-1963/9/4/007     Document Type: Article

References (14)

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