Integration of high voltage field emission display followed by macro- and nanostructural analysis on microtip

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 18, Issue 2, 2000, Pages 888-895

  Kim, J M ^a   Lee, H W ^a   Choi, Y S ^a   Lee, N S ^a   Jung, J E ^a   Kim, J W ^a   Choi, W B ^a   Park, Y J ^a   Choi, J H ^a   Jin, Y W ^a   Yi, W K ^a   Park, N S ^a   Park, G S ^a   Chee, J K ^b  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^b Hong Ik University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; CATHODES; DISPLAY DEVICES; ELECTRIC BREAKDOWN; ELECTRON BEAMS;

FIELD EMISSION DISPLAYS (FED);

FIELD EMISSION CATHODES;

EID: 0034155846     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.591292     Document Type: Article

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