Studies of full color field emission display core technologies with the electrical and structural analysis

Applied Surface Science

Volumn 146, Issue 1, 1999, Pages 209-216

  Kim, J M ^a   Lee, H W ^a   Choi, Y S ^a   Jung, J E ^a   Lee, N S ^a   Jin, Y Y ^a   Park, N S ^a  

^a Samsung Advanced Institute of Technology (SAIT)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; ELECTRON BEAMS; FIELD EMISSION CATHODES; PHOSPHORS;

FIELD EMISSION DISPLAYS (FED); FIELD EMITTER ARRAYS (FEA);

ELECTRON SOURCES;

EID: 0032671132     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00045-8     Document Type: Article

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