The surface composition and spin polarization of NiMnSb epitaxial thin films

Europhysics Letters

Volumn 49, Issue 5, 2000, Pages 624-630

  Ristoiu, D ^a   Nozieres J P ^a   Borca, C N ^b   Komesu, T ^b   Jeong, H K ^b   Dowben, P A ^b  

^a LABORATOIRE DE CRISTALLOGRAPHIE   (France)

^b UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0034144814     PISSN: 02955075     EISSN: None     Source Type: Journal    
DOI: 10.1209/epl/i2000-00196-9     Document Type: Article

References (32)

1. DE GROOT R. A., MUELLER F. M., VAN ENGEN P. G. and BLISCHOW K. H. J., Phys. Rev. Lett., 50 (1983) 2024.
2. WIJNGAAD J. H., HAAS C. and DE GROOT R. A., Phys. Rev. B, 40 (1989) 9318.
3. DE GROOT R. A., MUELLER F. M., VAN ENGEN P. G. and BUSCHOW K. H. J., J. Appl. Phys., 55 (1984) 2151; DE GROOT R. A. and BUSCHOW K. H. J., J. Magn. & Magn. Mater., 43 (1984) 249.
4. DE GROOT R. A., MUELLER F. M., VAN ENGEN P. G. and BUSCHOW K. H. J., J. Appl. Phys., 55 (1984) 2151; DE GROOT R. A. and BUSCHOW K. H. J., J. Magn. & Magn. Mater., 43 (1984) 249.
5. VAN ENGEN P. G., BUSCHOW K. H. ,T., JONGEBREUR R. and ERMAN M., Appl. Phys. Lett., 42 (1983) 202.
6. KULATOV E. and MAZIN I. I., J. Phys. Condens. Matter, 2 (1990) 343.
7. KÜBLER J., WILLIAMS A. R. and SOMMERS C. B., Phys. Rev. B, 28 (1983) 1745.
8. KANG J.-S., PARK J.-G., OLSON C. G., YOUN S. J. and MIN B. I., J. Phys. Condens. Matter, 7 (1995) 3789.
9. SOULEN R. J. et al., Science, 282 (1998) 85.
10. BONA G. L., MEIER F., TABORELLI M., BUCHER E. and SCHMIDT P. H., Solid State Commun., 56 (1985) 391.
11. CABALLERO J. A., REILLY A. C., HAO Y., BASS J., PRATT W. P., PETROFF F. and CHILDRESS J. R., J. Magn. & Magn. Mater., 198-199 (1999) 55.
12. HANSSEN K. E. H. M., MIJNARENDS P. E., RABOU L. P. L. M. and BUSCHOW K. H. J., Phys. Rev. B, 42 (1990) 1533.
13. HORDEQUIN C., PIERRE J. and CURRAT R., J. Magn. & Magn. Mater., 192 (1996) 75.
14. KANG J.-S., HONG J. H., JUNG S. W., LEE Y. P., PARK J.-G., OLSON C. G., YOUN S. J. and MIN B. I., Solid State Commun., 88 (1993) 653.
15. PARK J.-H., VESCOVO E., KIM H.-J., KWON C., RAMESH R. and VENKATESAN T., Nature, 392 (1998) 794.
16. JAEWU CHOI, WALDFRIED C., LIOU S.-H. and DOWBEN P. A., J. Vac. Sci. Technol. A, 16 (1998) 2950.
17. JAEWU CHOI, JIANDI ZHANG, LIOU S.-H., DOWBEN P. A. and PLUMMER E. W., Phys. Rev. B, 59 (1999) 13453.
18. WEI ZHANG, XIAORU WANG and BOYD I., Appl. Phys. Lett., 73 (1998) 2745.
19. RISTOIU D., NOZIèRES J.-P. and RANNO L., submitted to J. Magn. & Magn. Mater.
20. CICCACI F., DROUHIN H.-J., HERMANN C., HOUDRÉ R,. and LAMPEL G., Appl. Phys. Lett., 54 (1989) 632.
21. WALDFRIED C., MCAVOY T., WELIPITIYA D., TAKASHI KOMESU, DOWBEN P. A. and VESCOVO E., Phys. Rev. B, 58 (1998) 7434.
22. WAGNER C. D., DAVIS L. E., ZELLER M. V., TAYLOR J. A., RAYMOND R. H. and GALE L. H., Surf. Interface Anal., 3 (1981) 211.
23. SCOFIELD J. H., J. Electron. Spectrosc. Relat. Phenom., 8 (1976) 129.
24. DOWBEN P. A. and MILLER A. (Editors), Core Level Spectroscopy and the Characterization of Surface Segregation in Surface Segregation Phenomena (CRC Press, Boston) 1990, p. 145.
25. SEAH M. P., JONES M. E. and ANTHONY M. T., Surf. Interface Anal., 6 (1984) 242; SEAH M. P., Surf. Interface Anal., 20 (1993) 243.
26. SEAH M. P., JONES M. E. and ANTHONY M. T., Surf. Interface Anal., 6 (1984) 242; SEAH M. P., Surf. Interface Anal., 20 (1993) 243.
27. PENN D. R., J. Electron. Spectrosc. Relat. Phenom., 9 (1976) 29.
28. RISTOIU D., BORCA C. N., NOZIèRES J. P. and DOWBEN P. A., in preparation.
29. COEHOORN R., HAAS C. and DE GROOT R. A., Phys. Rev. B, 31 (1985) 1980; OKUDA H., SENBA S., SATO H., SHIMADA K., NAMATAME H. and TANIGUCHI M., J. Electron. Spectrosc. Relat. Phenom., 101-103 (1999) 657; RAVIDRAN P., DELIN A., JAMES P., JOHANSSON B., WILLS J. M., AHUJA R. and ERIKSSON O., Phys. Rev. B, 59 (1999) 15680; RADER O. et al., Phys. Rev. B, 57 (1998) R689.
30. COEHOORN R., HAAS C. and DE GROOT R. A., Phys. Rev. B, 31 (1985) 1980; OKUDA H., SENBA S., SATO H., SHIMADA K., NAMATAME H. and TANIGUCHI M., J. Electron. Spectrosc. Relat. Phenom., 101-103 (1999) 657; RAVIDRAN P., DELIN A., JAMES P., JOHANSSON B., WILLS J. M., AHUJA R. and ERIKSSON O., Phys. Rev. B, 59 (1999) 15680; RADER O. et al., Phys. Rev. B, 57 (1998) R689.
31. COEHOORN R., HAAS C. and DE GROOT R. A., Phys. Rev. B, 31 (1985) 1980; OKUDA H., SENBA S., SATO H., SHIMADA K., NAMATAME H. and TANIGUCHI M., J. Electron. Spectrosc. Relat. Phenom., 101-103 (1999) 657; RAVIDRAN P., DELIN A., JAMES P., JOHANSSON B., WILLS J. M., AHUJA R. and ERIKSSON O., Phys. Rev. B, 59 (1999) 15680; RADER O. et al., Phys. Rev. B, 57 (1998) R689.
32. COEHOORN R., HAAS C. and DE GROOT R. A., Phys. Rev. B, 31 (1985) 1980; OKUDA H., SENBA S., SATO H., SHIMADA K., NAMATAME H. and TANIGUCHI M., J. Electron. Spectrosc. Relat. Phenom., 101-103 (1999) 657; RAVIDRAN P., DELIN A., JAMES P., JOHANSSON B., WILLS J. M., AHUJA R. and ERIKSSON O., Phys. Rev. B, 59 (1999) 15680; RADER O. et al., Phys. Rev. B, 57 (1998) R689.