Can photoemission accurately probe the bulk electronic structure of the complex oxides?

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 16, Issue 5, 1998, Pages 2950-2955

  Choi, Jaewu ^a   Waldfried, C ^a   Liou, S H ^a   Dowben, P A ^a  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0032394144     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.581444     Document Type: Article

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