Polarization and statistical analysis of scenes containing a semireflector

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 17, Issue 2, 2000, Pages 276-284

  Schechner, Yoav Y ^a   Shamir, Joseph ^a   Kiryati, Nahum ^b  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^b TEL AVIV UNIVERSITY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; DIAGNOSTIC IMAGING; HUMAN; IMAGE PROCESSING; LIGHT; PHOTOGRAPHY; RADIATION SCATTERING; THEORETICAL MODEL;

DIAGNOSTIC IMAGING; HUMANS; IMAGE PROCESSING, COMPUTER-ASSISTED; LIGHT; MODELS, THEORETICAL; PHOTOGRAPHY; SCATTERING, RADIATION;

EID: 0034134043     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.17.000276     Document Type: Article

References (26)

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