Vision through semireflecting media: Polarization analysis

Optics Letters

Volumn 24, Issue 16, 1999, Pages 1088-1090

  Schechner, Yoav Y ^a   Shamir, Joseph ^a   Kiryati, Nahum ^b  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^b TEL AVIV UNIVERSITY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042134716     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.24.001088     Document Type: Article

References (9)

1. H. Fujikake, K. Takizawa, T. Aida, H. Kikuchi, T. Fujii, and M. Kawakita, Opt. Rev. 5, 93 (1998).
2. Y. Y. Schechner, N. Kiryati, and R. Basri, in IEEE International Conference on Computer Vision (Institute of Electrical and Electronics Engineers, New York), pp. 1061-1066.
3. W. A. Shurcliff and S. S. Ballard, Polarized Light (Van Nostrand, Princeton, N.J., 1964), pp. 100-104.
4. N. Ohnishi, K. Kumaki, T. Yamamura, and T. Tanaka, in Computer Vision-ECCV '96, R. Buxton and R. Cipolla, eds., Vol. 1065 of Lecture Notes in Computer Science (Springer-Verlag, Berlin, 1996), pp. 636-646.
5. D. Weinshall, Nature 341, 737 (1989).
6. L. B. Wolff, J. Opt. Soc. Am. A 11, 2935 (1994).
7. H. Farid and E. H. Adelson, "Separating reflections from images by use of independent-components analysis," J. Opt. Soc. Am. A (to be published).
8. M. Born and E. Wolf, Principles of Optics, 5th ed. (Pergamon, Oxford, 1975), pp. 38-45.
9. Link to the raw images through http://www.ee. technion.ac.il/~yoavs/publications.