Theoretical and experimental limits of the analysis of III/V semiconductors using EELS

Micron

Volumn 31, Issue 4, 2000, Pages 411-427

  Leifer, K ^a   Buffat, P A ^a   Stadelmann, P A ^a   Kapon, E ^a  

^a EPFL   (Switzerland)

Author keywords

AlGaAs heterostructures; Bloch wave calculation; EELS; Electron channelling; OMCVD; Quantification; Quantum structures; Self ordering; Surface layers

Indexed keywords

EID: 0034064676     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(99)00119-5     Document Type: Article

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