Imaging insulating oxides by elevated-temperature STM

Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

  Castell, M R ^a   Muggelberg, C ^a   Dudarev, S L ^a   Sutton, A P ^a   Briggs, G A D ^a   Goddard, D T ^b  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b SELLAFIELD LTD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC RESOLUTION; BULK TERMINATION; DEFECT SITES; EMPTYSTATE; INTERSTITIAL OXYGEN; ROOM TEMPERATURE; ROW STRUCTURE; SCANNING TUNNELLING MICROSCOPY; STM IMAGES;

ELECTRONIC STRUCTURE; OXYGEN;

SCANNING TUNNELING MICROSCOPY;

EID: 33646644603     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051275     Document Type: Article

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