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Volumn 80, Issue 1, 2000, Pages 1-10
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High-resolution electron microscopy of steps on misfitting lamellar γ-α2 interfaces in a Ti-44 at.% Al-8 at.% Nb alloy
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL GROWTH;
CRYSTAL STRUCTURE;
DIFFUSION;
DISLOCATIONS (CRYSTALS);
HIGH RESOLUTION ELECTRON MICROSCOPY;
INTERFACES (MATERIALS);
TRANSMISSION ELECTRON MICROSCOPY;
BURGERS VECTORS;
INTERFACIAL DISCONNECTIONS;
MIGRATION MECHANISM;
MISFITTING LAMELLAR;
PONDS TOPOLOGICAL THEORY;
QUINTERNARY ALLOY;
TITANIUM ALLOYS;
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EID: 0033990064
PISSN: 09500839
EISSN: None
Source Type: Journal
DOI: 10.1080/095008300176399 Document Type: Article |
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Times cited : (11)
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References (22)
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