Fracture origins in LiNbO3 wafers due to postprocessing micro-repolarization

Journal of Materials Research

Volumn 15, Issue 1, 2000, Pages 17-20

  Nagata, Hirotoshi ^a   Ichikawa, Junichiro ^a   Sakima, Mitsuru ^a   Shima, Kaori ^a   Haga, Eungi Min ^a  

^a SUMITOMO OSAKA CEMENT CO LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTALLINE MATERIALS; ELECTRIC CHARGE; ELECTROOPTICAL DEVICES; FERROELECTRIC THIN FILMS; FRACTURE; REDUCTION; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

MICRODOMAINS; REPOLARIZATION;

LITHIUM COMPOUNDS;

EID: 0033989996     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2000.0006     Document Type: Article

References (8)