메뉴 건너뛰기




Volumn 41, Issue 5, 2000, Pages 1791-1797

Correct determination of crystal lamellar thickness in semicrystalline poly(ethylene terephthalate) by small-angle X-ray scattering

Author keywords

Gel crystallization; Poly(ethylene terephthalate); SAXS

Indexed keywords

CORRELATION METHODS; CRYSTALLIZATION; OLIGOMERS; X RAY CRYSTALLOGRAPHY;

EID: 0033971321     PISSN: 00323861     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0032-3861(99)00327-4     Document Type: Article
Times cited : (103)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.