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Volumn 41, Issue 5, 2000, Pages 1791-1797
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Correct determination of crystal lamellar thickness in semicrystalline poly(ethylene terephthalate) by small-angle X-ray scattering
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Author keywords
Gel crystallization; Poly(ethylene terephthalate); SAXS
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Indexed keywords
CORRELATION METHODS;
CRYSTALLIZATION;
OLIGOMERS;
X RAY CRYSTALLOGRAPHY;
CRYSTAL LAMELLAR THICKNESS;
SEMICRYSTALLINE POLYMERS;
SMALL ANGLE X RAY SCATTERING (SAXS);
WIDE ANGLE X RAY DIFFRACTION (WAXD);
POLYETHYLENE TEREPHTHALATES;
CRYSTALLIN;
POLYETHYLENE TEREPHTHALATE;
ARTICLE;
CHEMICAL STRUCTURE;
CRYSTAL STRUCTURE;
POLYMERIZATION;
RADIATION SCATTERING;
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EID: 0033971321
PISSN: 00323861
EISSN: None
Source Type: Journal
DOI: 10.1016/S0032-3861(99)00327-4 Document Type: Article |
Times cited : (103)
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References (22)
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